{"id":1666,"date":"2019-03-18T14:11:20","date_gmt":"2019-03-18T13:11:20","guid":{"rendered":"https:\/\/csinordic.com\/sekundarionen-massenspektrometrie-tof-sims\/"},"modified":"2023-08-24T10:29:02","modified_gmt":"2023-08-24T09:29:02","slug":"sekundarionen-massenspektrometrie-tof-sims","status":"publish","type":"page","link":"https:\/\/csinordic.com\/de\/sekundarionen-massenspektrometrie-tof-sims\/","title":{"rendered":"Sekund\u00e4rionen-Massenspektrometrie (ToF-SIMS)"},"content":{"rendered":"

Sekund\u00e4rionen-Massenspektrometrie (ToF-SIMS)<\/h1><\/div>

Diese Technik erm\u00f6glicht die Analyse der chemischen Zusammensetzung von sehr d\u00fcnnen Schichten\/Filmen und festen Oberfl\u00e4chen von sehr kleinen Proben. Bei der Sekund\u00e4rionen-Massenspektrometrie wird die Probenoberfl\u00e4che mit Galliumionen beschossen. Wenn die Ionen die Oberfl\u00e4che treffen werden Ionen der obersten Atomlager der Probe abgespalten und durch Analyse dieser Ionen und Molek\u00fcle kann die Zusammensetzung sehr exakt bestimmt werden.
\nDie Technik kann mit abtragendem Sputtring kombiniert werden wo wechselweise eine Atomschicht analysiert und dann abgetragen wird. Auf diese Weise erh\u00e4t man ein Tiefenprofil der chemischen Zusammensetzung von der Oberfl\u00e4che in die Probe.<\/p>\n<\/div>

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  • <\/i><\/span>
    \nInstrument: TRIFT II<\/div><\/li>
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    \nHersteller: PHI<\/div><\/li>
  • <\/i><\/span>
    \nMisst: Flugzeit von Sekund\u00e4rionen von der Probe zum Detektor<\/div><\/li>
  • <\/i><\/span>
    \nErgebnis: Chemische Zusammensetzung einer Oberfl\u00e4che, Tiefenprofil der chemischen Zusammensetzung<\/div><\/li><\/ul>
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    <\/div><\/div><\/div><\/div><\/div><\/p>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"footnotes":""},"class_list":["post-1666","page","type-page","status-publish","hentry"],"yoast_head":"\nSekund\u00e4rionen-Massenspektrometrie (ToF-SIMS) - CSI Nordic<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/csinordic.com\/de\/sekundarionen-massenspektrometrie-tof-sims\/\" \/>\n<meta property=\"og:locale\" content=\"de_DE\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Sekund\u00e4rionen-Massenspektrometrie (ToF-SIMS) - CSI Nordic\" \/>\n<meta property=\"og:url\" content=\"https:\/\/csinordic.com\/de\/sekundarionen-massenspektrometrie-tof-sims\/\" \/>\n<meta property=\"og:site_name\" content=\"CSI Nordic\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/facebook.com\/csinordic\" \/>\n<meta property=\"article:modified_time\" content=\"2023-08-24T09:29:02+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Gesch\u00e4tzte Lesezeit\" \/>\n\t<meta name=\"twitter:data1\" content=\"4\u00a0Minuten\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/csinordic.com\/de\/sekundarionen-massenspektrometrie-tof-sims\/\",\"url\":\"https:\/\/csinordic.com\/de\/sekundarionen-massenspektrometrie-tof-sims\/\",\"name\":\"Sekund\u00e4rionen-Massenspektrometrie (ToF-SIMS) - 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