{"id":1689,"date":"2019-03-18T15:30:28","date_gmt":"2019-03-18T14:30:28","guid":{"rendered":"https:\/\/csinordic.com\/rasterelektronenmikroskopie-sem\/"},"modified":"2023-08-24T10:38:58","modified_gmt":"2023-08-24T09:38:58","slug":"rasterelektronenmikroskopie-sem","status":"publish","type":"page","link":"https:\/\/csinordic.com\/de\/rasterelektronenmikroskopie-sem\/","title":{"rendered":"Rasterelektronenmikroskopie (SEM)"},"content":{"rendered":"

Rasterelektronenmikroskopie (SEM)<\/h1><\/div>

Bei der Rasterelektronenmikroskopie (SEM von engl. Scanning electron microscopy) wird die Probe mithilfe eines Elektronenstrahls abgebildet der die Probe \u00fcber ein Raster scannt. Wenn die Elektronen auf die Probenoberfl\u00e4che treffen interagieren die Elektronen mit den Atomen in der Probe und eine Menge an Informationen wird erhalten. Zum Beispiel durch Detektierung der r\u00fcckgestreuten Elektronen von der Kollision erh\u00e4llt man Informationen \u00fcber Atomnummer und Topographie. Durch Analyse der R\u00f6ntgenstrahlung der durch die Kollision erregten Atome erh\u00e4lt man informationen \u00fcber die Zusammensetzung der Probe.
\nDurch die gro\u00dfe Tiefensch\u00e4rfe dieser Technik k\u00f6nnen Oberfl\u00e4chen mit gro\u00dfen Unterschieden in der Topographie abgebildet werden, z.B. Bruchfl\u00e4chen. Die Analyse kann bei mehrerer hundertausendfacher Vergr\u00f6\u00dferung mit einer Aufl\u00f6sung auf Nanometerniveau durchgef\u00fchrt werden.<\/p>\n<\/div>

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    Instrument: ULTRA 55<\/p>\n<\/div><\/li>

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    Hersteller: Zeiss<\/p>\n<\/div><\/li>

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    Misst: Sekund\u00e4relektronen und r\u00fcckgestreute Elektronen<\/p>\n<\/div><\/li>

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    Ergebnis: Topografie und chemische Zusammensetzung von Proben<\/p>\n<\/div><\/li><\/ul>

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    Ergebnis (Beispiel)<\/h2><\/div>
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    Sekund\u00e4relektroennbild (SE2) einer Schraube mit Verschlei\u00dfsch\u00e4den.<\/p>\n<\/div>

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    R\u00fcckstreuelektronenbild eines Schnitts durch beschichteten Stahl.<\/p>\n<\/div>

    <\/div><\/div><\/div><\/div><\/div><\/p>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"footnotes":""},"class_list":["post-1689","page","type-page","status-publish","hentry"],"yoast_head":"\nRasterelektronenmikroskopie (SEM) - CSI Nordic<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/csinordic.com\/de\/rasterelektronenmikroskopie-sem\/\" \/>\n<meta property=\"og:locale\" content=\"de_DE\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Rasterelektronenmikroskopie (SEM) - CSI Nordic\" \/>\n<meta property=\"og:url\" content=\"https:\/\/csinordic.com\/de\/rasterelektronenmikroskopie-sem\/\" \/>\n<meta property=\"og:site_name\" content=\"CSI Nordic\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/facebook.com\/csinordic\" \/>\n<meta property=\"article:modified_time\" content=\"2023-08-24T09:38:58+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Gesch\u00e4tzte Lesezeit\" \/>\n\t<meta name=\"twitter:data1\" content=\"5\u00a0Minuten\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/csinordic.com\/de\/rasterelektronenmikroskopie-sem\/\",\"url\":\"https:\/\/csinordic.com\/de\/rasterelektronenmikroskopie-sem\/\",\"name\":\"Rasterelektronenmikroskopie (SEM) - 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