{"id":1344,"date":"2019-01-17T13:27:56","date_gmt":"2019-01-17T12:27:56","guid":{"rendered":"https:\/\/csinordic.com\/secondary-ion-mass-spectrometry-tof-sims\/"},"modified":"2023-08-24T10:31:05","modified_gmt":"2023-08-24T09:31:05","slug":"secondary-ion-mass-spectrometry-tof-sims","status":"publish","type":"page","link":"https:\/\/csinordic.com\/en\/secondary-ion-mass-spectrometry-tof-sims\/","title":{"rendered":"Secondary ion mass spectrometry (ToF-SIMS)"},"content":{"rendered":"

Secondary ion mass spectrometry (ToF-SIMS)<\/h1><\/div>

With ToF-SIMS chemical composition of very thin layers and films and solid samples can be analyzed. During secondary ion mass spectrometry the surface is sputtered with gallium ions. When these hit the sample surface ions from the outmost atomic layers of the sample are released which can be used to determine the chemical composition.
\nThe method can be used in combination with sputtring to remove layers to get a depth profil of the chemical composition from surface inwards.<\/p>\n<\/div>

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    \n

    Instrument: TRIFT II<\/p>\n<\/div><\/li>

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    \nManufacturer: PHI<\/div><\/li>
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    \nMeasures: Time of flight of secondary ions from sample surface to detector<\/div><\/li>
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    \nResult: Chemical composition and depth profile (of the composition) of the surface.<\/div><\/li><\/ul>
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    <\/div><\/div><\/div><\/div><\/div><\/p>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"footnotes":""},"class_list":["post-1344","page","type-page","status-publish","hentry"],"yoast_head":"\nSecondary ion mass spectrometry (ToF-SIMS) - CSI Nordic<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/csinordic.com\/en\/secondary-ion-mass-spectrometry-tof-sims\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Secondary ion mass spectrometry (ToF-SIMS) - CSI Nordic\" \/>\n<meta property=\"og:url\" content=\"https:\/\/csinordic.com\/en\/secondary-ion-mass-spectrometry-tof-sims\/\" \/>\n<meta property=\"og:site_name\" content=\"CSI Nordic\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/facebook.com\/csinordic\" \/>\n<meta property=\"article:modified_time\" content=\"2023-08-24T09:31:05+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"4 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/csinordic.com\/en\/secondary-ion-mass-spectrometry-tof-sims\/\",\"url\":\"https:\/\/csinordic.com\/en\/secondary-ion-mass-spectrometry-tof-sims\/\",\"name\":\"Secondary ion mass spectrometry (ToF-SIMS) - 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